Philips Technos TREX 620 total reflection X-ray fluorescence spectrometer system designed for the measurement of surface contamination on 150mm and 200mm silicon and compound semiconductor wafers. System designed for inline process control in the clean room. Spectrometer equipped with a tungsten anode sealed x-ray tube and an additional molybdenum anode sealed tube. System has built in P-C with touch screen.
For specs and additional photos, please refer to our website:
www.photonicmicrodevices.com
Company: Photonic Microdevices Inc. Contact Name: Roland Levy Status:Premium Member
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Ad Number: 129509
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