The T5375 is capable of testing 300-mm sized wafer simultaneously up to 256 devices in DRAM wafer process tests. And in the flash memory final process, the system has achieved full testing of high-speed synchronous flash memories. The high speed testing in both wafer process and final process can be performed at speeds up to 143 MHz.
Major Specifications
Target Devices: DRAM, SDRAM, DDR devices, SRAM,
Flash memories, Direct RDRAM, EPROM,
Masked ROM, etc.
Test Speed: 143 MHz/286 MHz (DDR mode)
Simultaneous Testing: Up to 256 devices (x8 or x9 bits)
Test Heads: Up to 2 stations
High-voltage and High-current driver equipped
DC Test Units: Up to 64 units per station
Programmable power supply: Up to 256 units per station
Company: JAD Group, Inc. Contact Name: Joe DiBartolo
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Ad Number: 160310
About this Advantest T5375 listing - This is a for sale classified ad for a used, surplus or second hand Advantest T5375 equipment. It is posted by one of our members. To contact the seller of this item please click the WebMail icon at the bottom of this Advantest T5375 listing or view this user's member profile for detailed contact info.
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