Advantest T5375 Memory Test System

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JADMember

Location:

Asia and Pacific - Other

Ad Status:

Closed

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Description:

The T5375 is capable of testing 300-mm sized wafer simultaneously up to 256 devices in DRAM wafer process tests. And in the flash memory final process, the system has achieved full testing of high-speed synchronous flash memories. The high speed testing in both wafer process and final process can be performed at speeds up to 143 MHz.

Major Specifications

Target Devices: DRAM, SDRAM, DDR devices, SRAM,
Flash memories, Direct RDRAM, EPROM,
Masked ROM, etc.
Test Speed: 143 MHz/286 MHz (DDR mode)
Simultaneous Testing: Up to 256 devices (x8 or x9 bits)
Test Heads: Up to 2 stations
High-voltage and High-current driver equipped
DC Test Units: Up to 64 units per station
Programmable power supply: Up to 256 units per station