JEOL-7500E Scanning Electron Microscope

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Classifieds / Semiconductor Mfg / Metrology & Inspection

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Posted by:	jenbarenholtz
Location:	New Jersey
Ad Status:	Closed

Manufacturer:	JEOL
Type:	IC-SEM
Model:	JWS-7500E
Year (or range of years):	1995
Condition:	Excellent
Price (in US dollars):	USD
Quantity:	1
Type of Seller:	Dealer Owner
Description:
Wafer Inspection System featuring... -Oxford EDS detector -Max Accelerating Voltage: 6KV -Cable length: 15m between operation console and power supply(5m between Main Console and Operation Console) -Parralax image software to save images (vs. printing) -Tilt: -15 to +60 degrees -Rotation: 360 degrees continuous -EOS resolution: 10nm -Stage accuracy: +/- 10 microns -Stage configuration: 8" Item is crated, but crates can be opened if needed for inspection

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About this JEOL JWS-7500E listing - This is a for sale classified ad for a used, surplus or second hand JEOL JWS-7500E equipment. It is posted by one of our members. To contact the seller of this item please click the WebMail icon at the bottom of this JEOL JWS-7500E listing or view this user's member profile for detailed contact info.